PPT Slide
- Technique to analyze local orientation, microstructure and grain boundary structure in polycrystalline materials.
- Uses electron back-scatter diffraction pattern (EBSP) data to re-create microstructure
- Links local orientation (micro-texture) with grain morphology
- OIM data is further used for the calculation of statistical density distributions such as grain size distribution (GSD), the orientation distribution functions (ODFs), the misorientation distribution function (MDF), and other higher order correlation functions.
ORIENTATION IMAGING MICROSCOPY (OIM)