PPT Slide

ORIENTATION IMAGING MICROSCOPY (OIM)

• HOWEVER
  • Wright et al, ICOTOM (1996), suggested that OIM can not be used for the study of heavily deformed materials.
  • The presence of high dislocation density in heavily strained materials causes the EBSPs to be more diffuse.
  • Difficulty in obtaining EBSPs, therefore rendering data to be unreliable.

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